Electrical test

  • Passive component test
  • Precision DC parametric test
  • Relay parametric test
  • Parametric and functional test on IC’s at various ATE test locations
  • Structural IC test

Customers of MASER Engineering are active in a wide range of electronic device applications. MASER Engineering has a wide range of electrical test equipment and knowhow available to support many engineering applications.

Supplier qualification programs on passive components (resistors / capacitors / inductors / filters / crystals), electro-mechanical devices (relays / connectors / switches) and active semiconductor devices (diodes / transistors / smart power / RF) can be executed including the electrical tests. In some IC test applications, MASER Engineering is using the ATE test sites of the customers supply chain to avoid additional test program development costs. We have local access to other main frame ATE such as Teradyne Flex and Teradyne J750.

We have software available to read and to process test result files from ATE systems (STDF files). For digital IC read point testing we can use our VERIGY Ocelot ZFP structural test system to verify the functional behavior of these devices. Structural test resolves the internal scan path node failures in digital IC’s. In addition, the system tests the DC parametric behavior of the device under test. This system is also used to demonstrate and localize functional device fault locations during a failure analysis project.