MASER Engineering announces the expansion of the ISO/IEC 17025:2005 scope with HTOL, LTOL, ELFR and PTC tests. These tests are used to qualify semiconductors according to JESD47 and AEC-Q100.

High Temperature Operating Life (HTOL) according to JESD22-A108
Low Temperature Operating Life (LTOL) according to JESD22-A108
Early Life Failure Rate (ELFR) according to JESD22-A108
Power Temperature Cycle (PTC) according to JESD22-A105

Already a large amount of tests can be executed under ISO/IEC 17025:2005 accreditation e.g.:

High Temperature Storage Life (HTSL) according to JESD22-A103
Temperature Humidity Bias (THB) according to JESD22-A101
Highly Accelerated Temperature and Humidity Stress (HAST) according to JESD22-A110
Temperature Cycling (TC) according to JESD22-A104
Unbiased Temperature Humidity (UHAST) according to JESD22-A118
Unbiased Temperature Humidity (AC) according to JESD22-A102
Bond Pull Strength (BPS) according to MIL-STD-883 method 2011
Bond Shear (BS) according to JESD22-B116 / AEC-Q100-010
Solderball Shear (SBS) according to JESD22-B117 / AEC-Q100-001

MASER Engineering has an ISO/IEC 17025:2005 accreditation which is valid until 1 October 2013 by the Dutch Accreditation Council RvA for the majority of the offered activities with accreditation L 388. The scope is also accessible on www.rva.nl (lab code L 388).

Further expansion of the ISO/IEC 17025:2005 scope is planned in 2012 for ESD and Latch-Up.